Multichannel short/open tester that can be embedded in existing test equipment
| Number of test points | 128 pins (during 4-terminal measurement, up to 32 sets) | |||||
|---|---|---|---|---|---|---|
| Number of test steps | Round-robin short/open : 128 pins Component data : Max. 10000 steps Charge data : 40 sets Pin contact data : 128 pins Group data : 255 groups |
|||||
| Test parameters and measurement ranges | Round-robin short/open : | 4 Ω to 400 kΩ (Default: 40 Ω) | ||||
| Component tests : | Possible | |||||
| Component tests | Resistance : | 400 μΩ to 40 MΩ | ||||
| Open : | 4 Ω to 4 MΩ | |||||
| Short : | 400 mΩ to 40 Ω | |||||
| Test signals | DC constant voltage : | 100 m / 400 mV : 2 ranges | ||||
| DC constant current : | 2 m / 20 mA, 2 ranges | |||||
| Measurement unit | DC ammeter : | Ammeter 80 μ / 800 μ / 4 m / 40 m Arms, 4 ranges | ||||
| DC ammeter : | 250 n / 2.5 μ / 25 μ / 250 μ / 2.5 m / 25 m A f.s., 6 ranges | |||||
| Scanner unit | Analog software : | 128 channels/board (2-/4-terminal switchable, no guarding) | ||||
| Judgment range | -99.9% to +999.9% or absolute value | |||||
| Measurement times | Round-robin short/open : From approx. 0.8 ms per pin Component : From approx. 0.9 ms per step |
|||||
| Statistics functionality | Defect rate tabulation and graph display test, group, and overall; component test histogram; operating time cumulative and subtotal displays | |||||
| External I/O (*2) | Using I/O Board E4220 (*1) : 60 inputs, 56 outputs | |||||
| Power supply | 100 to 240 V AC (±10%), single-phase, 50 Hz / 60 Hz, max. 130 W | |||||
| Dimensions and mass | 200 mm (7.87 in) W × 323 mm (12.72 in) H × 298 mm (11.73 in) D, 10 kg (352.7 oz) | |||||
| Included accessories | Instruction manual ×1, Test leads ×1, Power cord ×1, Metal fittings ×1, Installation CD ×1 | |||||
